Ключевые слова: HTS, magnets, flux pumps, YBCO, persistent current mode, coils pancake, eddy currents, losses, flux flow resistance, coated conductors, fabrication, experimental results
Ключевые слова: bulk, cylinders, numerical analysis, flux flow, mechanical properties, stress effects
Ключевые слова: dc reactor, magnets, coils toroidal, HTS, flux flow, YBCO, coated conductors, numerical analysis, inductance, geometry effects, winding configurations, design parameters
Ключевые слова: HTS, bulk, flux flow, mechanical properties, stress effects, tensile tests, numerical analysis
Ключевые слова: LTS, cable-in-conduit conductor, geometry effects, critical caracteristics, critical current, degradation studies, ac losses, strand geometry, NbTi, flux flow, loop
Ключевые слова: HTS, YBCO, doping effect, REBCO, pinning, nanoparticles, nanoscaled effects, coated conductors, TFA-MOD process, flux creep, flux flow, modeling, pinning centers artificial, critical caracteristics, Jc/B curves, angular dependence, current-voltage characteristics, n-value, experimental results
Ключевые слова: pinning force, LTS, NbTi, Nb3Sn, saturation, modeling, flux flow, YBCO, single crystals, critical caracteristics, Jc/B curves, V3Si, neutron irradiation, experimental results, numerical analysis
Ключевые слова: LTS, Nb, tapes, current-voltage characteristics, flux flow, thermal stability, experimental results, critical caracteristics
Kiss T., Nagaya S., Kashima N., Shiohara Y., Watanabe T., Inoue M., Yamada Y., Miyata S., Ibi A., Mori M., Enpuku K., Zulkifli Z.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, CVD process, microstructure, homogeneity, current density, dissipative properties, flux flow, experimental results, fabrication
Ключевые слова: bulk, disks, pinning, flux flow, magnetic properties, numerical analysis
Nakamura T., Takahashi K., Awaji S., Watanabe K., Kiss T., Inoue M., Yamada Y., Ibi A., Shiohara Y.Y., Mitsui D., Fujiwara T.N.
Matsumura T., Shimizu H., Yokomizu Y., Mutsuura K.(k_mutsuura@echo.nuee.nagoya-u.ac.jp)
Matsumura T., Shimizu H., Murayama N., Aritake T., Yokomizu Y.(yokomizu@nuee.nagoya-u.ac.jp)
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Tokutomi H., Shoyama T.
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